Received 20 April 2021 accepted 14 October 2021. © 2021 American Association for the Advancement of Science. We define a stress-induced, error-prone OFM pathway that generates mutations that counteract replication defects and drive cellular evolution and survival.Įrror-prone, stress-induced 3’ flap-based Okazaki fragment maturation supports cell survival Consequently, little 5′ flap was formed, suppressing rad27Δ-induced lethality at restrictive temperatures. However, at certain regions, 3′ flaps formed secondary structures that facilitated 3′ end extension rather than degradation, producing alternative duplications with short spacer sequences, such as pol3 internal tandem duplications. Restrictive temperature stress activated Dun1, facilitating transformation of unprocessed 5′ flaps into 3′ flaps, which were removed by 3′ nucleases, including DNA polymerase δ (Polδ). Here, we report that an error-prone Okazaki fragment maturation (OFM) pathway is activated at restrictive temperatures in rad27Δ yeast cells.
How cells with DNA replication defects acquire mutations that allow them to escape apoptosis under environmental stress is a long-standing question.
0 kommentar(er)
